| Title |
In situ TEM study on crack propagation in nanoscale Au thin films |
| Authors |
Wang HT, Nie AM, Liu JB, Wang P, Chen BD, Liu HZ, Fu MS |
| Publisher |
SCRIPTA MATERIALIA |
| Volume page |
v 65, n 5, p 377-379, Sep. 2011 |
| Reference NO. |
SCI::797DV EI:20112814129745 |
| Type |
国际学术期刊 |
| Download |
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